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Calendar of Physics Talks Vienna
| Speaker: | Marco Bertolini (Kavli IPMU - The University of Tokyo) |
| Abstract: | I will discuss a mirror duality of (0,2) superconformal field theories that are not related to deformations of (2,2) theories. These theories describe a point in the moduli space of complete intersections Calabi-Yau manifolds equipped with bundles whose rank is strictly greater than that of the tangent bundle. As it was the case for Gepner models,
the mirror isomorphism is given in terms of an orbifold procedure at an exactly solved point in the moduli space of the theory. Geometrically, the duality is manifest in terms
of hybrid models. This is a joint work with Ronen Plesser.
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| Date: | Tue, 18.12.2018 |
| Time: | 13:45 |
| Duration: | 60 min |
| Location: | Fakultät für Physik, Erwin-Schrödinger-Hörsaal, Boltzmanngasse 5, 5. Stock |
| Contact: | S. Fredenhagen, D. Grumiller, J. Knapp |
| Higgs production through gluon fusion with electroweak corrections in the 2HDM |
| Speaker: | Christian Sturm (Würzburg) |
| Date: | Tue, 18.12.2018 |
| Time: | 14:30 |
| Duration: | 60 min |
| Location: | Fakultät für Physik, Kleiner Seminarraum, Boltzmanngasse 5, 5. Stock |
| Contact: | A. Hoang, S. Plätzer, M. Procura |
| Watching Organic Semiconductor Films Grow and Melt – an X-ray View |
| Speaker: | Jiří Novák (Central European Institute of Technology and Masaryk University, Brno/Czech Republic) |
| Abstract: | Organic semiconductor (OSM) thin films play an important role in new low cost energy saving devices including organic light emitting diodes, organic solar cells, and organic thin film transistors. The optical and electric performance of the devices is closely related to the crystal structure of the organic layers and to the morphology of organic/organic and organic/inorganic interfaces. X-ray scattering techniques are efficient tools for studying structure and morphology of the films in situ in real time during growth and solvent or thermal treatment.
After a short introduction to the field of OSMs, I will present results of combined synchrotron grazing incidence small angle scattering (GISAXS) and X-ray reflectivity (XRR) real-time studies of growth of thin films of prototypical OSM molecules diindenoperylene (DIP) and buckminsterfullerene (C60) on on Si/SiOx and mica(001) surfaces, res |
| Date: | Tue, 18.12.2018 |
| Time: | 16:00 |
| Location: | Technische Universität Wien, Institut für Angewandte Physik, E134 yellow tower „B“, 5th floor, Sem.R. DB gelb 05 B (room number DB05L03), 1040 Wien, Wiedner Hauptstraße 8-10 |
| Contact: | Univ.Prof. Dr. Ulrike Diebold |
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